José Luis Padilla de la Torre

UNIV GRANADA
28 InfluRatio
4 Indexed Publications in Altmetrics.com

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Article Which drivers are at risk? Factors that determine the profile of the reoffender driver Padilla, Jose-Luis; Doncel, Pablo; Gugliotta, Andres; Castro, Candida ACCIDENT ANALYSIS AND PREVENTION 0001-4575 (2018) DOI / 10.1016/j.aap.2018.07.021 OPEN ACCESS LEVEL /
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Review Understanding the Components and Determinants of Police Attitudes Toward Intervention in Intimate Partner Violence Against Women: A Systematic Review Serrano-Montilla, Celia; Lozano, Luis M.; Alonso-Ferres, Maria; Valor-Segura, Inmaculada; Padilla, Jose-Luis TRAUMA VIOLENCE & ABUSE 1524-8380 (2021) DOI / 10.1177/15248380211029398 OPEN ACCESS LEVEL /
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Article Which drivers are at risk? Factors that determine the profile of the reoffender driver Padilla, Jose-Luis; Doncel, Pablo; Gugliotta, Andres; Castro, Candida ACCIDENT ANALYSIS AND PREVENTION 0001-4575 (2018) DOI / 10.1016/j.aap.2018.07.021 OPEN ACCESS LEVEL /
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Article Quantum Enhancement of a S/D Tunneling Model in a 2D MS-EMC Nanodevice Simulator: NEGF Comparison and Impact of Effective Mass Variation Medina-Bailon, Cristina; Carrillo-Nunez, Hamilton; Lee, Jaehyun; Sampedro, Carlos; Padilla, Jose Luis; Donetti, Luca; Georgiev, Vihar; Gamiz, Francisco; Asenov, Asen MICROMACHINES (2020) DOI / 10.3390/mi11020204 OPEN ACCESS LEVEL / Gold DOAJ, Green published, Green accepted
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Article Quantum Enhancement of a S/D Tunneling Model in a 2D MS-EMC Nanodevice Simulator: NEGF Comparison and Impact of Effective Mass Variation Medina-Bailon, Cristina; Carrillo-Nunez, Hamilton; Lee, Jaehyun; Sampedro, Carlos; Padilla, Jose Luis; Donetti, Luca; Georgiev, Vihar; Gamiz, Francisco; Asenov, Asen MICROMACHINES (2020) DOI / 10.3390/mi11020204 OPEN ACCESS LEVEL / Gold DOAJ, Green published, Green accepted
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Article Multisubband Ensemble Monte Carlo Analysis of Tunneling Leakage Mechanisms in Ultrascaled FDSOI, DGSOI, and FinFET Devices Medina-Bailon, Cristina; Padilla, Jose L.; Sadi, Toufik; Sampedro, Carlos; Godoy, Andres; Donetti, Luca; Georgiev, Vihar P.; Gamiz, Francisco; Asenov, Asen IEEE TRANSACTIONS ON ELECTRON DEVICES 0018-9383 (2019) DOI / 10.1109/ted.2019.2890985 OPEN ACCESS LEVEL / Green accepted
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